Galvanized Coating - Fe 20 mil Probe – QNix 8500 Basic

Description

The QNix 8500 MI Fe 20 mil for Thin Coating Thickness Measurement is an extension of our modular measurement system QNix®8500: A pen shape probe for precise measurements of particularly thin coatings & Parts with small geometry. In addition to our standard probes, operating based on the Hall-sensor principle, we now offer a magnetic inductive measurement probe for measurements within a measuring range of 0 to 20 mil (0 to 500 microns), capable of the most precise measurements of non-ferromagnetic coatings especially within the lower measuring range. Designed to measure thin non-ferromagnetic metal coatings (such as: chromium, copper, zinc, etc) as well as lacquer, enamel or plastic coatings on steel substrates using the magnetic-inductive measuring method, our probes deliver measurements in accordance with the DIN EN ISO 2178, ISO 2808 and ASTM B499 standards. Thanks to our pen shape probe manual adjustments on measuring objects are easy to achieve and accurate. For applications demanding highest precision, we recommend mounting the probe on a measurement stand, available with additional sample holders. Our new probe – the latest modular addition to the QNix®8500 measurement system – allows customers to individually specify calibrations for convenient measurements of thin coatings on small parts.

Measurements on angle brackets, fasteners, shim washers, screws, bolts and nuts. Ensuring – within a measuring range of 20 µm – the reliability of protective coatings on steel bolts and nuts used for e.g. rotor mounts of wind energy plants, fasteners on bridge or window fixings. Used for hard thin film coatings (Physical Vapour Deposition – PVD coatings), such as: TiN, TiCrN, CrN and TiAIN. Now, user-oriented PC software complements our QNix®8500 measurement system, adding a variety of options for reality based data evaluation and gauge configuration: Wireless communication between PC and gauge. Gauge memory read-out. Flexible data evaluation with Microsoft Excel. Gauge configuration using the PC. Supporting all common languages. Online measurements

Scope of Supply

• Measuring probe MI Fe 20 mil
• QNix 8500 Basic -Body gauge only
• Carrying-case (probe case only or together with the QNix®8500 carrying-case)
• 2 alignment rings
• Steel reference plate, circular, 25 mm in diameter
• Reference foils: ca. 0.23 mil, 0.4 mil, 0.9 mil, 1.9 mil ( 6, 11, 24, 50 µm)
• Certificate of calibration
• Instruction manual

Technical Data QNix® 8500 Magnetic-Inductive Measurement Probe MI Fe 20 mil

• Product Brochure

Product Brochure

Measuring Method: Magnetic Measuring Method Fe: Magnetic-induction refer to (*Fe)
According to Standards: DIN EN ISO 2808, DIN 50981, ISO 2178, BS 5411 (11), BS 3900 - C5, ASTM B499, ASTM D 1186, ASTM D 7091
Probe Type: QNix®8500 probe type
Measurement Range Fe: 0.0 to 500 µm or approx. Fe: 0.0 to 20 mil
Different Measuring Units µm/mil: with the QNix®8500 gauge
Measuring Interval: 1600 ms
Repetitive Precison in regard to the Automation-Standards: ± (0.1 µm + 0.8% of the measurement value)
Accuracy in regard to the Automation-Standards after Calibration: ± (0.3 µm + 2% of the measurement value) after calibration
Smallest Measuring Area Diameter: 7.0 mm
Measuring radius: 3.5 mm (*1)
Smallest Radius of Curvature: smallest convex radius : 4 mm (*1)
smallest concave radius: 5 mm (*2)
Smallest Thickness of Base Material: Fe: 0,4 mm (*1)
Range of Operating Temperature: 0 °C to 50 °C (32 °F to 122 °F)
Permissible Storage Temperature: -10 °C to 60 °C ( 14 °F to 140 °F )
Electric Power Supply: From gauge
Dimensions (L x W x H in mm): Probe without connection cable 120 mm x 12 mm x 12 mm (4.72" x 0.47" x 0.47")
Weight: approx. 95 g
(*Fe) Measuring of non-ferromagnetic coatings on ferromagnetic substrate, e.g. measuring on steel- or iron substrates
(*1) in regard to a maxmum deviation of 10 % of the measurement value at coating thicknesses higher than 1 % of the measuring range. Measurements on smallest geometrical forms are possible with specific one-point or two-point calibrations.
(*2) in regard to the measuring probes geometry Technical data subject to change without notice